Fire Publications - width of size distribution

width of size distribution

• Selection of Calibration Particles for Scanning Surface Inspection Systems.
  Flatness, Roughness, and Discrete Defect Characterization for Computer Disks, Wafers, and Flat Panel Displays. International Society for Optical Engineering (SPIE). Proceedings. Volume 2862. August 8-9, 1996, Denver, CO, Society of Photo-Optical Instrument Engineers, WA, 104-118 pp, 1996.
  Mulholland, G. W.; Bryner, N. P.; Liggett, W.; Scheer, B. W.; Goodall, R. K.