Fire Publications - Kim, J. H.

Kim, J. H.

• Slip Correction Measurements of Certified PSL Nanoparticles Using a Nanometer Differential Mobility Analyzer (Nano-DMA) for Knudsen Number From 0.5 to 83.
  Journal of Research of the National Institute of Standards and Technology, Vol. 110, No. 1, 31-54, January/February 2005.
  Kim, J. H.; Mulholland, G. W.; Kukuck, S. R.; Pui, D. Y. H.