Building Publications - VanLandingham, M. R.

VanLandingham, M. R.

• Advances in Materials and Mechanics.
  Advances in Building Technology International Conference. December 4-6, 2002, Hong Kong, China, 3-16 pp, 2002.
  Chong, K. P.; VanLandingham, M. R.; Sung, L. P.
• Advancing Nanoscale Indentation Measurements Toward Quantitative Characterization of Polymer Properties.
  Microscopy and Microanalysis, Vol. 6, No. Suppl. 2:Proceedings, 1108-1109, 2000.
  VanLandingham, M. R.; Villarrubia, J. S.; Meyers, G. F.; Dineen, M.
• Characterization of Chemical Heterogeneity in Polymer Systems Using Hydrolysis and Tapping-Mode Atomic Force Microscopy.
  Journal of Polymer Science: Part B, Polymer Physics, Vol. 39, No. 13, 1460-1470, 2001.
  Raghavan, D.; Gu, X.; Nguyen, T.; VanLandingham, M. R.
• Characterization of Coating System Interphases With Phase Imaging AFM.
  Adhesion Society Annual Meeting, 24th. Proceedings. February 2001, Williamsburg, VA, Adhesion Society, Blacksburg, VA, Emerson, J. A., Editor(s), 68-70 pp, 2001.
  Nguyen, T.; Gu, X.; VanLandingham, M. R.; Giraud, M.; Dutruc-Rosset, R.; Ryntz, R.; Nguyen, D.
• Characterization of Heterogeneous Regions in Polymer Systems Using Tapping Mode and Force Mode Atomic Force Microscopy.
  Langmuir, Vol. 16, No. 24, 9448-9459, 2000.
  Raghavan, D.; VanLandingham, M. R.; Gu, X.; Nguyen, T.
• Characterization of Polyester Degradation Using Tapping Mode Atomic Force Microscopy.
  Polymeric Materials: Science and Engineering (PMSE) Fall Meeting. Volume 83. Proceedings. American Chemical Society (ACS) Division of Polymeric Materials: Science and Engineering. August 20-24, 2000, Washington, DC, American Chemical Society, Washington, DC, 336-337 pp, 2000.
  Gu, X.; Raghavan, D.; Nguyen, T.; VanLandingham, M. R.
• Direct Measurement of Plowing Friction and Wear of a Polymer Thin Film Using the Atomic Force Microscope.
  Journal of Materials Research, Vol. 16, No. 5, 1487-1492, 2001.
  Du, B.; VanLandingham, M. R.; Zhang, Q.; He, T.
• Effects of Stoichiometry and Epoxy Molecular Mass on Wettability and Interfacial Microstructures of Amine-Cured Epoxies.
  Adhesion Society Annual Meeting, 24th. Proceedings. February 2001, Williamsburg, VA, Adhesion Society, Blacksburg, VA, Emerson, J. A., Editor(s), 260-262 pp, 2001.
  Giraud, M.; Nguyen, T.; Gu, X.; VanLandingham, M. R.
• Effects of Ultraviolet Radiation Exposure on Vinyl Ester Resins: Characterization of Chemical, Physical and Mechanical Damage.
  Polymer Degradation and Stability, Vol. 79, 359-368, 2002.
  Signor, A. W.; VanLandingham, M. R.; Chin, J. W.
• Enhancing Sensitivity of Atomic Force Microscopy for Characterization of Surface Chemical Heterogeneity.
  Adhesion Fundamentals: From Moecules to Mechanisms and Modeling. Annual Meeting of the Adhesion Society, 26th. Proceedings. February 23-26, 2003, Myrtle Beack, SC, Koberstein, J. T.; Anderson, G. L., Editor(s)(s), 185-187 pp, 2003.
  Gu, X.; VanLandingham, M. R.; Fasolka, M.; Martin, J. W.; Jean, J. Y.; Nguyen, T.
• Mapping Chemically Heterogeneous Polymer System Using Chemical Modification and Atomic Force Microscopy.
  ACS Polymer Preprints, Vol. 41, No. 2, 1423-1424, 2000.
  Raghavan, D.; Gu, X.; VanLandingham, M. R.; Nguyen, T.
• Mapping Heterogeneity in Polymeric Materials Using Atomic Force Microscopy: Phase Imaging and Nanoindentation.
  Polymeric Materials: Science and Engineering (PMSE). Spring Meeting. Volume 82. Proceedings. American Chemical Society (ASME). March 26-30, 2000, San Francisco, CA, American Chemical Society, Washington, DC, 50-51 pp, 2000.
  Gu, X.; VanLandingham, M. R.; Raghavan, D.; Nguyen, T.
• Mapping Polymer Heterogeneity Using Atomic Force Microscopy Phase Imaging and Nanoscale Indentation.
  Macromolecules, Vol. 33, No. 7, 2573-2583, 2000.
  Raghavan, D.; Gu, X.; Nguyen, T.; VanLandingham, M. R.; Karim, A.
• Measurement Approaches to Develop a Fundamental Understanding of Scratch and Mar Resistance.
  Federation of Societies for Coatings Technology (FSCT) Technical Program Annual Meeting, 81st. November 12-14, 2003, Philadelphia, PA, Federation of Societies for Coatings Technology, Blue Bell, PA, 2003.
  VanLandingham, M. R.; Chang, N, K.; Wu, T. Y.; Chang, S. H.; Sung, L. P.; Jardret, V. D.
• Measurement Approaches to Develop a Fundamental Understanding of Scratch and Mar Resistance.
  Journal of Coatings Technology Research, Vol. 1, No. 4, 257-266, 2004.
  VanLandingham, M. R.; Sung, L. P.; Chang, N. K.; Wu, T. Y.; Chang, S. H.; Jardret, V. D.
• Metrology for Characterizing Sratch Resistance of Polymer Coatings.
  Annual Meeting, 82nd. Federation of Societies for Coatings Technology Meeting Technical Program. Federation of Societies for Coatings Technology (FSCT) Meeting. Proceedings. October 27-29, 2004, Chicago, IL, Federation of Societies for Coatings Technology, Blue Bell, PA, 2004.
  Sung, L. P.; Drzal, P. L.; VanLandingham, M. R.; Wu, T. Y.
• Nanocharacterization of Surface and Interface of Different Epoxy Networks.
  DD Polymer Interfaces and Thin Films. Materials Research Society (MRS) Symposium. Proceedings. Volume 710. 2002, Karim, A.; Frank, C. W.; Russel, T. P.; Nealey, P. F., Editor(s)(s), DD109.1-DD109.6 pp, 2002.
  Gu, X.; Ho, D. L.; Sung, L. P.; VanLandingham, M. R.; Nguyen, T.; Raghavan, D.
• Nanoidentation of Polymers: Overview.
  ACS Polymer Preprints, Vol. 41, No. 2, 1412-1413, 2000.
  VanLandingham, M. R.; Villarrubia, J. S.; Meyers, G. F.
• Nanoindentation of Polymers: An Overview.
  Advances in Scanning Probe Microscopy of Polymers. Macromolecular Symposia. Volume 167. Proceedings. 2001, Tsukruk, V. V.; Spencer, N. D., Editor(s)(s), 15-44 pp, 2001.
  VanLandingham, M. R.; Villarrubia, J. S.; Guthrie, W. F.; Meyers, G. F.
• Recent Progress in Nanoscale Indentation of Polymers Using the AFM.
  SEM IX International Congress on Experimental Mechanics. Proceedings. Society for Experimental Mechanics. June 5-8, 2000, Orlando, FL, 912-915 pp, 2000.
  VanLandingham, M. R.; Villarrubia, J. S.; Meyers, G. F.
• Solid Micromechanics: Research and Challenges.
  Micromechanics Europe (MME 2002) Workshop, 13th. Proceedings. October 6-8, 2002, Sinaia, Romania, 347-358 pp, 2003.Journal of Micromechanics and Microengineering, 2003.
  Chong, K. P.; Sung, L. P.; Ho, D. L.; VanLandingham, M. R.