Characterization of Polyester Degradation Using Tapping Mode Atomic Force Microscopy.
Characterization of Polyester Degradation Using Tapping
Mode Atomic Force Microscopy.
Gu, X.; Raghavan, D.; Nguyen, T.; VanLandingham, M. R.
Polymeric Materials: Science and Engineering (PMSE) Fall
Meeting. Volume 83. Proceedings. American Chemical
Society (ACS) Division of Polymeric Materials: Science
and Engineering. August 20-24, 2000, Washington, DC,
American Chemical Society, Washington, DC, 336-337 pp,
microscopy; coatings; degradation; heterogeneity;
nanoindentation; phase imaging
Tapping mode AFM was used to examine the microstructure
of polyester films before and after exposure to an
alkaline solution. Bright-colored microgel domains and
dark-colored interstitial regions were observed in phase
images of the unexposed samples. The microstructure of
polyester film was substantially changed after exposure.
More and deeper pits were observed on the sample
surfaces with increasing exposure time. Phase imaging
and force curves indicated that the properties of the
regions in the degradation pits are significantly
different from those of undegraded regions. The
localized nature of pit initiation and propagation is
believed to result from the heterogeneity of the