Nanoidentation of Polymers: Overview.
Nanoidentation of Polymers: Overview.
(143 K)
VanLandingham, M. R.; Villarrubia, J. S.; Meyers, G. F.
ACS Polymer Preprints, Vol. 41, No. 2, 1412-1413, 2000.
Keywords:
microscopy; blind reconstruction; mechanical properties;
nanoindentation; tip shape calibration; polymers
Abstract:
Indentation measurements made with atomic force
microscopy (AFM) probes are relative measurements,
largely due to the lack of information regarding the tip
shape of the AFM probes. Also, current tip shape
calibration procedures used in depth-sensing indentation
rely on indentation results from a reference material,
and the reproducibility of these methods has been poor
in a recent interlaboratory comparison. In this paper, a
technique referred to as blind reconstruction is used as
a material-independent method for characterizing the tip
shapes of probes used with the AFM to indent polymeric
materials. Results using this method are compared to
results of a material-dependent tip shape analysis,
particularly with regard to experimental uncertainties.
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National Institute of Standards and Technology
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