BFRL Publications - electrical mobility

electrical mobility

• Measurement of the 100 nm NIST SRM 1963 by Differential Mobility Analysis.
  Aerosol Science and Technology, Vol. 31, 39-55, 1999.
  Mulholland, G. W.; Bryner, N. P.; Croarkin, C.
• Selection of Calibration Particles for Scanning Surface Inspection Systems.
  Flatness, Roughness, and Discrete Defect Characterization for Computer Disks, Wafers, and Flat Panel Displays. International Society for Optical Engineering (SPIE). Proceedings. Volume 2862. August 8-9, 1996, Denver, CO, Society of Photo-Optical Instrument Engineers, WA, 104-118 pp, 1996.
  Mulholland, G. W.; Bryner, N. P.; Liggett, W.; Scheer, B. W.; Goodall, R. K.