BFRL Publications - Germer, T. A.
Germer, T. A.
- Polarization of Light Scattered by Particles on Silicon Wafers.
Surface Characterization for Computer Disks, Wafers, and Flat Panel Displays. Proceedings. SPIE Proceedings Series Volume 3619. Society of Photyo-Optical Instrumentation Engineers (SPIE). January 28, 1999, San Jose, CA, Society of Photo-Optical Instrumentation Engineers, Bellingham, WA, 80-89 pp, 1999.
Sung, L. P.; Mulholland, G. W.; Germer, T. A.
- Polarized Light-Scattering Measurements of Dielectric Spheres Upon a Silicon Surface.
Optics Letters, Vol. 24, No. 13, 866-868, July 1, 1999.
Sung, L. P.; Mulholland, G. W.; Germer, T. A.
Building and Fire Research Laboratory
National Institute of Standards and Technology
Gaithersburg, MD 20899