BFRL Publications - Jean, J. Y.
Jean, J. Y.
- Enhancing Sensitivity of Atomic Force Microscopy for Characterization of Surface Chemical Heterogeneity.
Adhesion Fundamentals: From Moecules to Mechanisms and Modeling. Annual Meeting of the Adhesion Society, 26th. Proceedings. February 23-26, 2003, Myrtle Beack, SC, Koberstein, J. T.; Anderson, G. L., Editor(s)(s), 185-187 pp, 2003.
Gu, X.; VanLandingham, M. R.; Fasolka, M.; Martin, J. W.; Jean, J. Y.; Nguyen, T.
Building and Fire Research Laboratory
National Institute of Standards and Technology
Gaithersburg, MD 20899